New York, Dec 6: An IIT-Mumbai graduate has been honoured by the Washington University in St. Louis by being named McDonnell international scholar.
The use of brain scans to detect Alzheimer's disease was the topic of a lecture by Dr. John Csernansky, director of the Silvio O. Conte Center for Neuroscience Research at Washington University, St. Louis, at Vanderbilt University March 9. The lecture was part of the Brainstorm 2006 lecture...
Thu, Mar 16 | from Vanderbilt University News